@InProceedings{PerrinsMcEwan12,
  title =        "{SEU} {P}rotection for {H}igh-{R}eliability {F}lash {F}ile {S}ystems",
  author=        "Perrins,  Neil J. and McEwan,  Alistair A.",
  editor=        "Welch, Peter H. and Barnes,  Frederick R. M. and Chalmers,  Kevin and Pedersen,  Jan Bækgaard and Sampson,  Adam T.",
  pages =        "219--220",
  booktitle=     "{C}ommunicating {P}rocess {A}rchitectures 2012",
  isbn=          "978-0-9565409-5-9",
  year=          "2012",
  month=         "aug",
  abstract=      "Single Event Upsets (SEU) are a primary reliability concern
     for
electronics in high radiation, highly hostile
     environments such as
space. In the case of Field
     Programmable Gate Arrays, the concern is
firstly that data
     stored in RAM can be corrupted, and secondly
     that
configurable logic blocks can become damaged or
     corrupted. In this
talk we will present our considerations
     of this problem in the context
of an SRAM-based high
     reliability flash file system. We will firstly
demonstrate
     our test harness where we simulate the injection of
     SEUs
into our FPGA. We will then discuss how we propose to
     build a self
repairing configuration using triple modular
     redundancy and partial
dynamic reconfiguration. Finally we
     will discuss how the reliability
of the system may be tested
     and measured such that it can be used with
confidence in
     either data acquisition or control system applications
     in
rad-hard environments."
}